PR1168445 - Consulting and design services for the project Concept development of a Design-for-Test
Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., ErlangenFrist abgelaufen
- Frist (abgelaufen)
- vor 70 Tagen abgelaufen
- Geschätzter Wert
- nicht angegeben
- Verfahren
- Offenes Verfahren, Dienstleistung
- Ort der Leistung
- Erlangen (Stadt) · Bayern
- Veröffentlicht
- Laufzeit
- 01.10.2026 bis 30.09.2028
- Für KMU geeignet
- ja, laut Bekanntmachung
- CPV
- 73100000 Dienstleistungen im Bereich Forschung und experimentelle Entwicklung
Die Vergabeunterlagen liegen auf der Plattform des Auftraggebers.
Beschreibung
The two projects named above are cyber-security applications to fullfill requirements for the European Cyber-Security-Act. They will be developed in 22 nm FD-SOI silicon technology and beyond. To assure testability on block level up to system on chip top level, a strategy for DFT insertion and simulation must be developed and implemented. Therefore, one meeting per quarter shall be performed at the Fraunhofer Institute for Integrated Circuits in Erlangen-Tennenlohe. Furthermore, flexibility of working hours is required in order to be able to react promptly to urgent adjustments.
2 Lose
- Los 1Lot 1: Functional Verification
The following tasks are initially planned: • Setup of verification environment, server and simulation tool infrastructure • Familiarization with the design functionalities algorithms, structure and design hierarchy • Setup of test plans for hierarchical block level verification with UVM • Continuous development of testcases and execution of simulations, analysis and documentation of the …
ohne Wert - Los 2Lot 2: Design for Test
The following tasks are initially planned: • Setup of DFT environment for implementation and simulation with Cadence or Siemens EDA depending on the projects requirements o E.g. JTAG, MBIST, SCAN,… • Defining a DFT strategy for the individual projects • Familiarization with the project’s functionality, structure and design hierarchy • Continuous and iterative improvement of the test coverage • …
ohne Wert